Defect - level and Fault Coverage
نویسنده
چکیده
2.Introduction VLSI yield and quality measured as defect-level and fault coverage are important concepts related to electronic production and testing. [1] Both of defect-level and fault coverage are wildly used in today’s test field. For VLSI chips, it’s necessary for manufacturer to make the tradeoff between the test cost and high fault coverage. Some defect chips will be shipped to the market in terms of this kind of tradeoff. Therefore, using defect-level to specify the quality is important and needed.
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